Synthesis and characterization of a versatile semiconductor material: indium phosphide
GAO Qiang1, MAO Caixia2,XUE Li2, WU Tao3, HU Yonghong1
(1.School of Resources and Environmental Science and Engineering, Hubei University of Science and Technology,Xianning 437100,Hubei, China;2.School of Electronic and Information Engineering, Hubei University of Science and Technology, Xianning 437100, Hubei, China;3.School of Engineering, Xianning Vocational Technical College,Xianning 437100, ubei, China)
Abstract:Indium phosphide films were deposited using glass substrates at 773 K by utilizing the chemical spray pyrolysis method. The indium phosphide film exhibited polycrystalline nature with cubic lattice and had a preferred orientation along (111) direction with a direct bandgap of 1.49 eV. The films showed n-type conductivity and the value of resistivity was found to be 5.18×103 Ω·cm. Thus, indium phosphide film has potential applications in high frequency, high power materials and optoelectronic devices in the future.